Analyzing refractive index profiles of confined fluids by interferometry part II: Multilayer and asymmetric systems

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Analyzing refractive index profiles of confined fluids by interferometry.

This work describes an interferometry data analysis method for determining the optical thickness of thin films or any variation in the refractive index of a fluid or film near a surface. In particular, the method described is applied to the analysis of interferometry data taken with a surface force apparatus (SFA). The technique does not require contacting or confining the fluid or film. By ana...

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ژورنال

عنوان ژورنال: Analytica Chimica Acta

سال: 2016

ISSN: 0003-2670

DOI: 10.1016/j.aca.2016.07.009